• Asia/Kolkata
  • English
  • Login

26th National Symposium on Cryogenics and Superconductivity

22-24 February 2017
VECC
Show menu
Home > Timetable > Session details > Contribution details
get PDF of this contribution get XML of this contribution get ICal of this contribution
 
Development of Superconducting Joint Characterization Test Facility at IUAC, New Delhi
 
Content: Superconducting magnets used for NMR/MRI applications are operated in persistent mode, which means they are initially charged to the required operating current and then magnet terminals are shorted using persistent current switch. This will provide a non-decaying current which leads to a very stable magnetic field. The temporal stability of MRI magnet needs to be better than 0.1 ppm/hr. The temporal stability of the magnet field would depend on the resistance of the joints between the multi-filamentary NbTi terminals of the MRI magnet. The desired temporal stability can only be achieved by superconducting joints of resistance ~10E-12 to 10E-13 Ω. A superconducting magnet based test rig for characterization of superconducting joint is under development at IUAC. This paper briefly describes the complete set up with details of test methodology of superconducting joint at 4.2 K.
Id: 62
Place: VECC
Room: Hall A (Main Auditorium)
Starting date:
23-Feb-2017   12:15 (Asia/Kolkata)
Duration: 15'
Contribution type: Contributory Talk
Primary Authors: Mr. KUMAR, Mukesh (Inter-University Accelerator Centre, New Delhi, India)
Co-Authors: Dr. KAR, Soumen (Inter-University Accelerator Centre, New Delhi, India)
Mr. SUMAN, Navneet kumar (Inter-University Accelerator Centre, New Delhi, India)
Mr. SAINI, S.K. (Inter-University Accelerator Centre, New Delhi, India)
Mr. SONI, Vijay (Inter-University Accelerator Centre, New Delhi, India)
Mr. THEKKETHIL, Sankar Ram (Inter-University Accelerator Centre, New Delhi, India)
Mr. ANTONY, Joby (Inter-University Accelerator Centre, New Delhi, India)
Dr. SHARMA, Ram Gopal (Inter-University Accelerator Centre, New Delhi, India)
Mr. HARSH, Rajesh (Society for Applied Microwave Electronics Engineering and Research, Mumbai, India)
Dr. DATTA, Tripti Sekhar (Inter-University Accelerator Centre, New Delhi, India)
Presenters: Mr. KUMAR, Mukesh
 
Included in session: Technical Session 6
Included in track: Cryogenic System Instrumentation and Control